This paper presents the design of a microwave near-field probe for highly accurate fault detection in dielectric materials operating over the 8-12 GHz band. A near-field microwave probe capable of generating uniform amplitude and phase distributions across its radiating aperture is essential for accurately detecting faults in homogeneous dielectric media. The probe developed in this work demonstrates enhanced measurement stability and detection precision across the 8-12 GHz range. It is capable of detecting cracks as small as 0.2 mm in width and depth at 8 GHz. CST Microwave Studio simulations confirm that the proposed probe exhibits desirable near-field characteristics, including uniform aperture field distribution, low reflection coefficient (S11 <-10 dB), and high sensitivity to small dielectric discontinuities. The proposed probe is compact, reliable, and accurate for identifying defects in industrial, structural, and aerospace materials. Therefore, it contributes significantly to the advancement of non-destructive testing (NDT) technologies.