A scheme for reducing the need of multi-scan measurements of near electric-field information to a single-scan process is presented to simplify the construction of the sensing matrix required for performing computational microwave imaging system at K-band frequencies. For this purpose, we propose to perform only a single scan, and the obtained information is used to construct the multiple radiated near electric-field information associated to all transmit and receive units. Further, the performance of the constructed near electric-field is verified by generating an image of a test target by means of computational imaging using the scene reflectivity information. The proposed scheme helps in reducing the overall complexity of the nearfield scanning process associated to the computational imaging system.